Glossary of Terms and Acronyms Page 20 | 27 S Scanning Electron Microscopy, SEM Analysis SEM, is also known as SEM Microscopy and is used effectively in providing detailed high-resolution images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. The electron beam is scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. Ambient Tire Rubber Cryogenic Tire Rubber
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